Experimentally Determining the Top and Edge Contact Resistivities of Two-Step Sulfurization Nb-Doped MoS 2 Films Using the Transmission Line Measurement

IEEE Electron Device Letters(2019)

引用 7|浏览2
暂无评分
摘要
This study determined the top (vertical) and edge (horizontal) resistivities of metal-MoS2 contact based on the experimental results obtained using the transmission line measurement structure. A novel two-step sulfurization scheme was conducted for forming Nb-doped MoS2 films on a sapphire substrate. The edge contact resistivity, ρC_edge, was almost two orders of magnitude lower than the top conta...
更多
查看译文
关键词
Conductivity,Image edge detection,Two dimensional displays,Molybdenum,Sulfur,Metals,Resistance
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要