ExtraTime: Modeling and Analysis of Transistor Aging at Microarchitecture-Level

Long-Term Reliability of Nanometer VLSI Systems(2019)

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摘要
An aging-aware design of the entire processor, including the microarchitecture, is inevitable. To achieve this goal, it is necessary to assess transistor aging already in early design phases and to balance aging with other key design aspects (performance, power, and area). However, a major challenge is that detailed transistor-level information is not yet available in these phases making an accurate wearout estimation very difficult.
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