DRM and Optimization for Real-Time Embedded Systems

This chapter presents a new lifetime optimization techniques for real-time embedded processors considering the electromigration-induced reliability. For real-time embedded systems, many existing works focus on minimizing energy consumption while meeting all the deadlines for various real-time task models. Existing works include power management schemes, which exploits the available static and/or dynamic slack in the systems. For long-term reliability effects, reducing power will implicitly improve the reliability of a processor.