Fast EM Stress Evolution Analysis Using Krylov Subspace Method

Long-Term Reliability of Nanometer VLSI Systems(2019)

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摘要
As mentioned in Chap. 2 , the stress in the interconnect tree is not independent for multi-segment interconnect trees. More accurate EM modeling and analysis techniques are needed. Recently more accurate physics-based EM models and assessment techniques have been proposed. In Huang et al. (Proceedings of the Design Automation Conference (DAC), June 2014; IEEE Trans Comput Aided Des Integr Circuits Syst 35(11):1848–1861, 2016), a compact time to failure model based on the Korhonen’s equation, mentioned in Chap. 2 was proposed. Initially, this EM model worked for only a single wire segment but has been extended to deal with multi-segment interconnect trees based on the projected steady-state stress.
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