Near-Optimal Detection for Both Data and Sneak-Path Interference in Resistive Memories With Random Cell Selector Failures

Resistive random-access memory is one of the most promising candidates for the next generation of non-volatile memory technology. However, its crossbar array structure causes severe “sneak-path” interference, which also leads to strong inter-cell correlation. Recent works have mainly focused on sub-optimal data detection schemes by ignoring inter-cell correlation and assuming sneak-path interferen...