Infrared Thermal Imaging As Inline Quality Assessment Tool
Microelectronics reliability/Microelectronics and reliability(2023)
Abstract
Pulsed Infrared Thermography (PIRT) is a very fast and non-destructive technique for testing various types of specimens. This makes PIRT interesting for inspections in industrial production lines. Especially for the die attach interface inspection of sintered and soldered electronic components and layer to layer interfaces in fiber-reinforced plastic (FRP), the industry is looking for alternatives to cost extensive X-ray methods and the time-consuming scanning acoustic microscopy. This work will present PIRT as inline quality assessment tool with an integrated technique to perform reliable component inspections on a wide range of different specimens.
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Key words
Pulsed infrared thermography,Non-destructive technique,Sintered and soldered electronic components,Production line,Failure analysis
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