A method based on complementary transmission and reflection measurements for extracting the optical properties of a thin film
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV(2022)
摘要
This conference presentation, “A method based on complementary transmission and reflection measurements for extracting the optical properties of a thin film” was presented at the Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV conference at SPIE Photonics West 2022.
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