Efficient Characterization Methodology for Low-Frequency Noise Monitoring

Luca Pirro,Talha Chohan, Philipp Liebscher,Maximilian Juettner, Felix Holzmueller,Ruchil Jain,Yannick Raffel,Konrad Seidel,Ricardo Revello Olivo,Alban Zaka,Jan Hoentschel

2024 IEEE 36TH INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, ICMTS 2024（2024）

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Key words

Low-frequency Noise,Characterization Methodology,Integrable,Gate Oxide,Gate Length,Maximum Fluctuation,Gate Width,Impact Of Geometry,First Approximation,Types Of Devices,Measurement Setup,Noise Distribution,Total Width,Slope Of Ln,Maximum Oscillation

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