Special Issue on Reliability

Souvik Mahapatra,Andreas Kerber,Christian Monzio Compagnoni, Randy Koval,Gaudenzio Meneghesso,David Sheridan,Stephen Ramey,Runsheng Wang, Jim Stathis,Kevin J. Chen,Ben Kaczer,Lucio Pancheri,Elyse Rosenbaum,Chandra Mouli,Hei Wong

IEEE transactions on electron devices（2019）

SCI 2区

SCI 3区

Indian Inst Technol

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摘要

Reliability is an important consideration during semiconductor technology development, which ensures that the performances of devices, circuits, and systems are maintained over a specified period of time, leading to successful products. Device reliability is at the core of overall product reliability, which continues to remain an important area of research and has attracted the attention of IEEE T...

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关键词

Special issues and sections,Reliability,Semiconductor devices,Integrated circuit reliability,Materials reliability,Performance evaluation