В статье представлены результаты исследований в области разработки отечественных рентгеновских томографов. Описаны конструкция первого серийного рентгеновского томографа семейства МРКТ. Приведены результаты томографических исследований различных объектов.

AbstractX-ray computer methods of research (projection microfocus radiography and microtomography), which are used to study the problem of hidden defects of seeds and investigate its impact on sowing quality, have been considered. The description and main characteristics of technical means that were used to obtain digital two-dimensional and three-dimensional (tomographic) X-ray images of seeds have been given and the possible ways of their quantitative computer processing and analysis have been discussed. Conclusions about the abilities of the methods of projection microfocus radiography and microtomography to study the features of the internal structures of a seed that are related to the violation of its integrity have been formulated.

X-ray computer methods of research (projection microfocus radiography and microtomography), which are used to study the problem of hidden defects of seeds and investigate its impact on sowing quality, have been considered. The description and main characteristics of technical means that were used to obtain digital two-dimensional and three-dimensional (tomographic) X-ray images of seeds have been given and the possible ways of their quantitative computer processing and analysis have been discussed. Conclusions about the abilities of the methods of projection microfocus radiography and microtomography to study the features of the internal structures of a seed that are related to the violation of its integrity have been formulated.

The design of the first domestic microfocus X-ray tube with massive target and electrostatic 200-kV electron-beam focusing is presented. A monoblock X-ray device based on this tube and intended for projection radiography is described. The main characteristics of the X-ray unit, including its fluoroscopic parameters, are estimated.