Polycrystalline alumina samples (α-Al2O3, purity: 99.8%) were irradiated with 63Cu5+ ions of 32MeV kinetic energy (≈0.5MeV/u) up to fluences of 1014ions/cm2 at various temperatures ranging from 295 to 973K. Ion beam induced luminescence and emission spectra were monitored at wavelengths from 320 to 800nm. Optical absorption measurements were performed to deduce color center formation. Results were evaluated by the Birks model to determine the material’s radiation hardness. The applicability of alumina as scintillation screens for ion beam diagnostics could be extended by enhanced temperature operation. Analysis of the emission spectra shows a complex color center formation behavior as a function of fluence and temperature.

Polycrystalline alumina samples (α-Al2O3, purity: 99.8%) were irradiated by 63Cu heavy ions (E=0.5MeV/u) at various fluences. After irradiation, absorption measurements were performed within the wavelength range from 200 to 1000nm to evaluate color center evolution. Thermal annealing behavior of the created defects was investigated with respect to annealing temperature and duration. Complex color center formation processes depending on particle fluence and temperature could be observed. Calculated activation energies necessary for F- and F+-center migration are ∼0.3eV for temperatures ranging from RT to ∼673K.

Inorganic scintillation screens were irradiated with swift heavy ion beams at GSI accelator facility, using protons up to Uranium ions as projectiles. Beams were extracted from the synchrotron SIS18 with high energy (≈300MeV/u) in slow and fast extraction mode. During irradiation the scintillation response of the screens was recorded by two different optical setups simultaneously to investigate the light output, profile characteristics and emission spectra. In principle fast extracted beams induce lower light output than slow extracted beams. The output per deposited energy shows a decreasing dependency with respect of the atomic number. Emission spectra showed no significant defects of the materials, neither at irradiation with increasing beam intensity nor during long time irradiation.

FAIR will serve as a versatile accelerator for ions of energies between 200 MeV/u and 29 GeV/u (FAIR start version) with an intensity variation from some 10 3 to 10 13 ppp. In the transport lines the transverse profile determination will be mainly based on intercepting methods: Scintillation screens, SEM-Grids and gas filled MWPCs. These devices are tested at the existing GSISIS18 where ions are extracted either in fast mode within 1 µs or slow mode within 0.3s. The imaging properties of scintillation screens were investigated. Over intensities 10 7 to 10 9 ppp the light output for the screens is linear with respect to the ion intensity. Wire-based methods using SEM-Grids and MWPCs are discussed.

For FAIR (Facility for Antiproton and Ion Research) imaging properties of inorganic scintillators for high energetic heavy ion beams were studied. In order to investigate the characteristics of scintillation response and transverse beam profile, several experiments were conducted with slow (200 ms) and fast (1 μs) extracted 350 MeV/u Uranium beams from SIS18. The extracted particle number was varied between 10 5 and 10 9 particles per pulse for the irradiation of five different scintillators: Cr-doped alumina as well as two phosphors P46 and one P43. Additionally radiation resistance tests for two phosphor screens and the Cr-doped alumina screen were performed by irradiating with more than 700 pulses with 10 9 ions each. Linear response in scintillation light output over the large range of ion intensities is observed and for each material statistical moments were calculated.

The FAIR facility will provide intense primary beams of protons and heavy ions, or secondary beams of antiprotons and rare isotopes. The operation includes fixed-target experiments or subsequent facilities of independent storage rings and experiment beam lines. The particle beams greatly differ in ion species, energy, intensity, time structure, spot size and stopping power. Therefore, transverse beam profile measurements require a careful choice of detector type for each location in order to cope with the large dynamic range and operational demands. This contribution presents the actual status of FAIR detector developments for intercepting devices (SEM-grids, multi-wire proportional chambers, scintillating screens) as well as non-intercepting beam induced fluorescence monitors and ionization profile monitors. Recently, promising results were obtained with an 11.4 MeV/u Uranium beam in measurements of optical transmission radiation emitted from thin metal foils. The boundaries for the application area are described and basic detector parameters are summarized. FAIR BEAM PARAMETERS The main objectives of the upcoming FAIR (Facility for Antiproton and Ion Research) accelerator complex are to provide high-intensity ion beams, to generate beams of rare isotopes, as well as the production and storage of anti-protons [1]. Because the existing GSI accelerators Unilac and SIS18 will serve as injectors for FAIR a longterm upgrade program had been initiated including an extensive upgrade of beam diagnostic devices for the requirements of high-intensity operation. The foreseen FAIR standard operation modes require e.g. that Unilac routinely injects 510 U in a 150 μs macropulse into SIS18 as a booster synchrotron. From SIS18 the beam will be injected into the fast ramped superconducting heavy-ion synchrotron SIS100, the main accelerator of the future FAIR complex. SIS100 will deliver high-energy high-intensity protonand heavy ion beams near the space charge limit. The requirements for the experiments with radioactive ion beams include acceleration of up to 410 U ions/s to end energies of 400-2700 MeV/u, either in single bunches of 30-90 ns, or as slowly extracted beam with extraction times of several seconds. For the production of anti-protons 2.510 protons per pulse will be accelerated to 29 GeV with a repetition rate of 0.1 Hz and an output bunch length of 50 ns. It is clear that the large variety of beam parameters along the FAIR accelerator chain requests for well-matched diagnostic devices. Moreover, the high-energy beam transport lines (HEBT) have to be designed for the transport of ion beams with a large range of parameters. Because of the multiplexed experiment operation, the beams principally might differ on a pulse-by-pulse manner in ion species, energy, intensity, time structure and transverse beam width. The interconnection of the existing SIS18 to SIS100 has a magnetic rigidity of 18 Tm and will transport slowly and fast extracted beams in the intensity range 110310 particles per pulse. Beams to and from the storage rings will be transported by 13 Tm and 100 Tm beam lines, but also here a large range of beam intensities of 10-10 particles per pulse is planned. Additionally, the aperture has a range of 100-150 mm, which sets up additional requirements with regard to the mechanical layout of beam profile monitors. INSTRUMENTATION FOR BEAM PROFILING For the broad range of parameters adequate instruments for beam profile detection have been developed at GSI in the past years. Devices are divided into intercepting instruments, like SEM-grid, multi-wire proportional chamber (MWPC) or scintillating screens (SCR), that are specifically used for beam optimization procedures and non-intercepting devices, like beam induced fluorescence monitors (BIF) or ionization profile monitors (IPM) that allow for online profile measurements. Table 1: Typical Parameters during Test Measurements for Development of FAIR Instrumentation Device Ion Energy [MeV/u] Detection Threshold [Part./Pulse] Spatial Resol. [mm] SEMGrid U 11.4 510 <1

In­or­ganic scin­til­la­tion screens are a com­mon trans­verse pro­file di­ag­nos­tics tool for beams ex­tracted from the heavy ion syn­chro­tron SIS18 at GSI. De­tailed in­ves­ti­ga­tions con­cern­ing light out­put, pro­file re­pro­duc­tion and spec­tral emis­sion were per­formed for phos­phor screens P43 and P46, sin­gle crys­tal YAG:Ce, alu­mina ce­ram­ics and Chromium-doped alu­mina (Chro­mox). The screens were ir­ra­di­ated with sev­eral ion species from pro­ton to Ura­nium. The par­ti­cle en­ergy was 300 MeV/u at in­ten­si­ties in the range from some 10⁶ to 10¹⁰ par­ti­cles per pulse, using ei­ther fast ex­trac­tion (1μsec­ond du­ra­tion) or slow ex­trac­tion (some 100 ms du­ra­tion). The light out­put co­in­cides for both ex­trac­tion types, i.e. no sig­nif­i­cant sat­u­ra­tion was ob­served. For all ma­te­ri­als the op­ti­cal emis­sion spec­trum is in­de­pen­dent on the ion species or beam in­ten­si­ties. Ra­di­a­tion hard­ness tests were per­formed with up to 10¹² ac­cu­mu­lated ions: The phos­phor P46 as well as YAG:Ce shows no sig­nif­i­cant de­crease of light out­put, while for P43 and Chro­mox a de­crease by 5 to 15 % was mea­sured. These re­sults will trig­ger the choice of the stan­dard screens in­stalled at the FAIR fa­cil­ity.

The scintillation process of inorganic material is a subject of high interest for material science. To answer questions of material damage processes the analysis of emission spectra is a common tool to compare possible influence of different ionizing particles. Results on the spectral emission of inorganic scintillators induced by high energy impact of heavy ions were obtained. The emission spectra show no significant variation within the investigated ranges of ion species and beam intensities.