We realized a laterally-d graded multilayer interference mirror using a special configuration of a sputtering deposition system. Metrology of this device was done (we have found the variation of period versus the lateral position) on the SB3 beamline, a CEA calibration station located at the 'Laboratoire pour l'Utilisation du Rayonnement Electromagnetique' in Orsay.A wide set of applications was shown by studying transmission of X-ray radiation transmitted through copper metal foil, especially spectral analysis in the L absorption edge.This analysis was simply realized by translating the laterally-d graded multilayer interference mirror at a fixed glancing angle. (C) 1999 Elsevier Science B.V. All rights reserved.
The concept of X-UV Lamellar Multilayer Amplitude Grating (LMAG) is introduced and a method of fabrication is given. Dynamical and kinematic theories of the diffraction by a LMAG are presented. Different applications of the LMAGs are considered. The first one is the achievement of a narrow bandpass multilayer monochromator for the X-UV domain. The second one is the reduction of specular background in the reflectivity curve of a multilayer structure. The third one is the polychromator system which allows one to split spatially and to perform a spectral sampling of a polychromatic beam. Finally we studied experimentally the behavior of an LMAG in conical mounting.
At CEA/Bruyeres-le-Chatel (Service GEM), then are facilities to calibrate X-ray detectors from 200 eV to 100 keV, with an accuracy of 4% at high energies (E > 3 keV).The source is the direct radiation from the X-ray tubes [C-K alpha (277 eV) to Ti-K alpha K beta (4.51/4.93 keV)] or fluorescence emission from secondary targets [ME(K alpha) (1.25 keV) to U-K alpha (98 keV)]. In addition, calibrations are carried out with the synchrotron radiation of the Super-AGO storage ring (LURE-Orsay), by selecting the monoenergetic beams with a double crystal monochromator which is tunable between 0.8 and 8 keV. The resolution is better than 1 eV. This last tool is very useful in the study of the absorption edges of the detector compounds (for example, Si K-edge and Ar K-edge).Some examples are presented of results obtained between 1 and 50 keV, with special reference to high flux detectors such as gold photocathodes and silicon avalanche photodiodes. Thick silicon photodiodes (for the high energy range) were also calibrated.
At CEA/Bruyères-le-Châtel (Service CEM), there are facilities to calibrate X-ray detectors from 200 eV to 100 keV, with an accuracy of 4% at high energies (E > 3 keV).
The silicon photodiode array Hamamatsu S3901 series (1024, 25 μm pixel) were primarily developed for the visible-UV spectral range, mainly for photon wavelengths between 200 and 1100 nm. By utilizing it without a quartz window, it is demonstrated that this sensor can be used for x rays, especially in the 1–10 keV range. Experimental measurements of the absolute detection efficiency of the photodiode array between 1.5 and 12 keV are presented. The experiments were performed on an x-ray tube-excited secondary targets and on the SB3 beamline at the Super ACO storage ring (LURE-Orsay). The measured spectral efficiency is compared with the results of a simple model calculation based on the data given in the Hamamatsu note. The simulation is in good agreement with the experimental data for a silicon active depth of 6 μm and a silicon dioxide passivation layer of 5 μm. The linearity is better than 1% and the spatial resolution is estimated to be 120 μm.
The spectrometric properties of several hydrophthalate crystals (KAP, RbAP, T1AP and CsAP) are studied by using the synchrotron radiation.We especially investigate cesium hydrophthalate for which little information is available in the literature.We present experimental measurements of rocking curves at 1000 eV and 2500 eV performed on the SB3 beamline of Super ACO storage ring (LURE-Orsay).
Flash X-Ray Radiography is commonly used as an important diagnostic concerning hydrodynamic behaviour studies for strong shocked material, essentially phenomena that alter the free surface of the material usually called matter ejection. After reflection of a strong shock wave on the free surface of a metallic sample, matter ejection phenomena stems mainly from geometrical defects present on this surface.
During shock waves experiments, integrety of the expanding free surface is required. Moreover, various mechanisms such as surface geometrical defects, metallurgical inhomogeneities, oxide, melting temperature, shock pressure, contribute to the deterioration of the so called free surface. For measurement of localized or distributed ejected mass due to those parameters, we use differents technics The first with ultra-light speed framing camera Barr and Stroud CP5 for optical recording of phenomenous.
Dans de nombreuses experiences de detonique et d'hydrodynamique, l'integrite des surfaces libres en vol est indispensable. Cependant, differents mecanismes tels que les defauts geometriques de surface, la structure metallurgique, le point de fusion, la pression de choc, contribuent a la deterioration de la surface libre. Pour mesurer l'ejection de matiere, localisee ou repartie, on utilise les techniques suivantes : l'enregistrement optique par une camera mecanooptique Barr and Stroud CP5 associee a un flash electronique, la radiographie X par un generateur pulse de 400 kV, et la mesure quantitative de la masse ejectee est obtenue en faisant l'hypothese du transfert de la quantite de mouvement entre l'ejecta et une cible mince dont on suit la mise en vitesse par Interferometrie Doppler Laser. Parallelement a ces etudes experimentales, un modele hydrodynamique a ete construit pour decrire le phenomene d'ejection de matiere provenant des defauts geometriques de surface et permettre ainsi une comparaison entre la theorie et les resultats experimentaux.