Thin‐film Si solar cells employ a back reflector (BR) for a more efficient use of the long wavelength light. Here, we have carried out a cross evaluation of metal (Ag‐based) and dielectric (white paint‐based) BR designs. Conclusive results have been reached regarding the most suitable BR type depending on the front electrode morphology, both with crater‐like and pyramidal texture. The ZnO/Ag BR is found to be optically more efficient because of improved light trapping, although the gain tends to vanish for rougher front electrodes. Thanks to non‐conventional Raman intensity measurements, this dependence on the front texture has been linked to the different weight of front and back interfaces in the light trapping process for the different morphologies. With rougher substrates, because the minor optical gain is accompanied by sputter‐induced electronic deterioration of the solar cell during the ZnO buffer layer deposition, the white paint‐based BR design is preferred. Copyright © 2016 John Wiley & Sons, Ltd.

We investigate the influence of surface texture on the effectiveness of reflectance by intermediate reflectors in thin-film tandem solar cells. Two distinct angular reflection regimes are identified. For large surfaces with large aspect ratios, frustrated total internal reflection or photon tunneling is found to be the dominating mechanism. We show that the parasitic reflection losses of commonly used randomly textured surfaces are explained by these distinct regimes and introduce a spectral reflectance parameter, which serves as a guideline for designing optimized spectrally selective intermediate reflectors.

High efficiency thin‐film silicon solar cells require texturing of the front contacts for advanced light management. However, optically favorable textures may be challenging in terms of the electrical performance. Solar cells deposited on very rough front contacts show a reduced open‐circuit voltage, Voc, as compared to flat TCOs. This contribution focuses on the impact of rough surfaces on the Voc in a‐Si:H solar cells deposited on six different textured front TCOs. With various i‐layer thicknesses from 100 to 400 nm the origin of the Voc loss is investigated. Based on our results we propose that the reduction of Voc in a‐Si:H solar cells are mainly due to defective regions in the bulk material induced by very rough textures. It is also seen that enlarging the i‐layer thickness can improve the Voc of solar cells when grown on very rough textures. By using variable illumination intensity measurements the existence of shunts could be evidenced.

We investigate the impact of intermediate reflectors on textured thin-film tandem solar cells. The electric near-field intensity distribution inside the layer stack is simulated by rigorous scattering theory. From those results, we extract the angular scattering intensity distribution in the top and bottom solar cell. The improvement in top cell quantum efficiency for various different intermediate reflectors is correlated with the coupling efficiency to leaky waveguide modes for a periodic triangular grating as a model system. In a further step, we show that the same approach can be applied to randomly textured substrates where light couples to a broad distribution of waveguide modes. The integrated scattering intensity above the critical angle of total internal reflection of this system is successfully correlated with the measured external quantum efficiency of tandem solar cells with various IRs. A local investigation of trapped light is presented to identify good light-trapping structures.

High-efficiency thin-film silicon solar cells require advanced textures at the front contacts for light management. In this contribution, the influence of the texture of various transparent conductive oxides (TCO) on the effectiveness of an intermediate reflector layer (IRL) in a-Si:H/μc-Si:H tandem solar cells is investigated. The employed front side TCOs include several types of sputter-etched ZnO:Al, LPCVD ZnO:B and APCVD SnO2:F. The topographies after different stages of the deposition process of the tandem solar cell, at the front TCO, after deposition of the amorphous top cell and after the deposition of the microcrystalline bottom cell, were characterized by atomic force microscopy at precisely the same spot. The external quantum efficiency of the fabricated solar cells were measured and successfully reproduced by a finite-difference time-domain method applying the measured topographies at each interface of the solar cell. With these simulations, the impact of structure type and feature size on the effectiveness of the IRL is investigated. The highest IRL effectiveness in a tandem solar cell was found for double-textured ZnO:Al. In this contribution, we study the interplay between interface textures and parasitic losses. Our findings are relevant for the design of topography for optimized IRL performance.

The optical performance of tandem a-Si:H/μc-Si:H (micromorph) thin film solar cell was investigated experimentally and by means of rigorous 3-D optical simulation. The interplay of intermediate reflectors, with different refractive indices and thicknesses, and front electrode surface texture was studied. Experiments and simulations show that LPCVD ZnO based front electrodes have the highest optical potential together with a low refractive index of the intermediate reflector. The intermediate reflector layer serves for redistribution of the mid-range solar spectrum between the top and bottom cell, while the sum of the top and bottom cell currents decreases with increasing IRL thickness. Additionally, promising concepts to increase the short-circuit current of the tandem solar cell are shown. The most important steps are related to lowering parasitic absorption in supportive layers by the introduction of silicon oxide layers and improving the light incoupling by introduction of anti-reflective layers.

Thin-film silicon solar cells are often deposited on textured ZnO substrates. The solar-cell performance is strongly correlated to the substrate morphology, as this morphology determines light scattering, defective-region formation, and crystalline growth of hydrogenated nanocrystalline silicon (nc-Si:H). Our objective is to gain deeper insight in these correlations using the slope distribution, rms roughness (σ(rms)) and correlation length (lc) of textured substrates. A wide range of surface morphologies was obtained by Ar plasma treatment and wet etching of textured and flat-as-deposited ZnO substrates. The σ(rms), lc and slope distribution were deduced from AFM scans. Especially, the slope distribution of substrates was represented in an efficient way that light scattering and film growth direction can be more directly estimated at the same time. We observed that besides a high σ(rms), a high slope angle is beneficial to obtain high haze and scattering of light at larger angles, resulting in higher short-circuit current density of nc-Si:H solar cells. However, a high slope angle can also promote the creation of defective regions in nc-Si:H films grown on the substrate. It is also found that the crystalline fraction of nc-Si:H solar cells has a stronger correlation with the slope distributions than with σ(rms) of substrates. In this study, we successfully correlate all these observations with the solar-cell performance by using the slope distribution of substrates.

Thin-film silicon tandem solar cells are composed of an amorphous silicon top cell and a microcrystalline silicon bottom cell, stacked and connected in series. In order to match the photocurrents of the top cell and the bottom cell, a proper photon management is required. Up to date, single-layer intermediate reflectors of limited spectral selectivity are applied to match the photocurrents of the top and the bottom cell. In this paper, we design and prototype multilayer intermediate reflectors based on aluminum doped zinc oxide and doped microcrystalline silicon oxide with a spectrally selective reflectance allowing for improved current matching and an overall increase of the charge carrier generation. The intermediate reflectors are successfully integrated into state-of-the-art tandem solar cells resulting in an increase of overall short-circuit current density by 0.7 mA/cm(2) in comparison to a tandem solar cell with the standard single-layer intermediate reflector.

p-type hydrogenated microcrystalline silicon oxide (µc-SiOx:H) was developed and implemented as a contact layer in hydrogenated amorphous silicon (a-Si:H) single junction solar cells. Higher transparency, sufficient electrical conductivity, low ohmic contact to sputtered ZnO:Al, and tunable refractive index make p-type µc-SiOx:H a promising alternative to the commonly used p-type hydrogenated microcrystalline silicon (µc-Si:H) contact layers. In this work, p-type µc-SiOx:H layers were fabricated with a conductivity of up to 10 −2 S/cm and a Raman crystallinity of above 60%. Furthermore, we present p-type µc-SiOx:H films with a broad range of optical properties (2.1 eV < band gapE04<2.8 eV and 1.6 < refractive indexn<2.6). These properties can be tuned by adapting deposition parameters, for example, the CO 2 /SiH 4 deposition gas ratio. A conversion efficiency improvement of a-Si:H solar cells is achieved by applying p-type µc-SiOx:H contact layer compared to the standard p-type µc-Si:H contact layer. As another aspect, the influence of the front side texture on a-Si:H p-i-n solar cells with different p-type contact layers, µc-Si:H and µc-SiOx:H, is investigated. Furthermore, we discuss the correlation between the decrease ofVocand the cell surface area derived from AFM measurements.