The grazing incidence interaction of a 10-keV electron beam with a planar surface of plexiglass is studied experimentally. Moreover, the electron passage through flat channels formed by such surfaces is investigated. The experiments reveal the presence of a guiding effect of the electron passage as in the case of a glass surface. However, there are some features, such as the existence of an initial elevation angle for the case of negative inclination angles of the plate. The formation of self-consistent charge on the surface of the plexiglass and its drain when the current is turned off occur more slowly than on the glass surface. This fact points to the difference in the surface conductivity of insulators.

The spectra of polarization bremsstrahlung are measured in the backscattering geometry during the interaction of 7-MeV electrons with a polycrystalline Ni foil. Measurement is conducted under conditions such that the size of the region of coherent X-ray radiation scattering in a target is on the order of 10 nm. The obtained results make it possible to suggest that using polarization bremsstrahlung as a new method for the diagnostics of the atomic structures of nanodisperse polycrystals is effective.

Исследуется эффект бесконтактного прохождения (guiding) электронов с энергией 10 кэВ в диэлектрических цилиндрических каналах и плоских каналах, образованных стеклянными пластинами. В экспериментах с двумя пластинами наблюдались обычные в таких случаях захват и распространение электронного пучка вдоль оси канала. Исследование отражения пучка от одной пластины выявило отклонение угла отражения от зеркального и зависимость характера отражения от длины пластины и величины тока.

The effect of the contactless transmission (guiding) of 10 keV electrons through cylindrical dielectric channels and planar channels formed by glass plates is studied. The capture and propagation of an electron beam along the channel axis, usual in these cases, are observed in the experiments with two plates. The deviation of the reflection angle from the specular angle and its dependence on the plate length and beamcurrent value under beam reflection from a single plate are investigated.

The experimental layout designed to study properties of focused parametric X-ray radiation generated by relativistic protons in a bent crystal and parametric X-ray radiation generated by relativistic ions and positrons at accelerator U70 is described. Preliminary results of measurements of spectra of characteristic and parametric X-rays observed at 50 GeV proton beam are shown and discussed. The origin of the background radiation that obstacles for detail research of the PXR properties at proton beam is identified. Moreover, the distribution of the ionization losses of relativistic charged particles in the X-ray detector similar to Landau distribution is measured and discussed.

The spectrum of polarization Bremsstrahlung is measured in backscattering geometry for 7-MeV electrons and a polycrystalline Ni foil without texture. The average size of grains in the foil is 300 nm. The results show the possibility of using a new method in the diagnostics of the atomic structure of polycrystalline materials with nanosized grains. The method is based on measuring the coherent component of polarization Bremsstrahlung.

The possibility of the determination of the position of an atom incorporated in the crystal unit cell by measuring the yield of characteristic radiation of this atom, excited by an X-ray wave nonuniform over the cell cross section, is shown. Such a wave can appear, in particular, in the mode of dynamical diffraction of an ordinary plane wave.

The spectra of polarization bremsstrahlung (PB) in the X-ray range induced by 7-MeV electrons in a polycrystalline copper target have been measured in the backscattering geometry for various orientations of the target relative to the electron beam. It is shown that the PB backscattering is sensitive to the texture of a target. The possibility of developing a new method based on the measurement of characteristics of the coherent PB component for the diagnostics of polycrystalline materials is considered.

The simple model of relativistic electron bremsstrahlung in a thin target is presented for conditions when its thickness less then a photon formation length. Results of our calculations obtained with account of an influence of target dielectric properties are in agreement with data at 25 GeV electron bremsstrahlung in thin layers of different media.

It is demonstrated that an efficient method can be created and used to determine the shape of grains in nanomaterials. This method relies on the discovered correlations between the amplitudes of different Bragg peaks for wideband X rays scattered in the sample on the grain shape.

The interaction between fast ions and the wall of a dielectric channel charged by randomly deposited ions of the flow was studied. It was shown that gradient forces repulsing ions from the wall caused by charge discreteness only arise when taking into consideration correlations in the relative position of the deposited charges.

The paper is devoted to theoretical and experimental studies of the new approach to X-ray diagnostics of mosaic crystals being proposed. The model of the scattering process on the crystals with the arbitrary distribution function of the crystalline grains over orientation angles is considered in detail. Experimental setup created on the base of this model is described as well as the first results of experimental studies conducted using highly oriented pyrolytic graphite with mosaicity 0.4 and 0.8 degrees.

A new method of measuring the angular distribution function of grains in mosaic crystals is proposed and studied.