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个人简介
Jen-Hao Lee received the B.S. and Ph.D. degrees in material science and engineering from National Chiao Tung University, Hsinchu, Taiwan, in 2001 and 2006, respectively.
He joined the Taiwan Semiconductor Manufacturing Company Limited (TSMC) in 2007 as a Principal Engineer in the Technology Reliability Physics Department and has been engaged in transistor reliability such as hot carriers and NBTI for MOS devices. Currently, he has been involved in device reliability for TSMC's advanced process technologies.
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论文共 4 篇作者统计合作学者相似作者
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Jen-Hao Lee, Eliot S.H. Chen,Yung-Huei Lee, Chun-Hung Lin,Chun-Yu Wu, Ming-Han Hsieh,Kevin Huang, Jhong-Sheng Wang, Yung-Sheng Tsai,Ryan Lu,Jiaw-Ren Shih
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