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排名必读论文期刊顶会热点AI 简史溯源树小脉星探人才迁徙塔尖人才国防情报追踪开源工具智慧手语
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论文共 59 篇作者统计合作学者相似作者

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Stochastic Aware Modeling of Voltage Controlled Magnetic Anisotropy MRAM
Bowen Wang, Fernando García-Redondo,Marie Garcia Bardon, Hyungrock Oh, Mohit Gupta,Woojin Kim, Diego Favaro, Yukai Chen,Wim Dehaene
IEEE Transactions on Nanotechnologyno. 99 (2024): 1-7
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Variability in Planar FeFETs-Channel Percolation Impact
K. Kaczmarek,M. Garcia Bardon,Y. Xiang, N. Ronchi,L. -A. Ragnarsson, U. Celano,K. Banerjee,B. Kaczer,G. Groeseneken,J. Van Houdt
IEEE Transactions on Electron Devicesno. 7 (2023): 3928-3934
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Cradle-to-gate Life Cycle Assessment of CMOS Logic Technologies
L. Boakes,M. Garcia Bardon, V. Schellekens, I-Y. Liu, B. Vanhouche, G. Mirabelli, F. Sebaai, L. Van Winckel, E. Gallagher, C. Rolin, L.-Å. Ragnarsson
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
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Backside Power Delivery: Game Changer and Key Enabler of Advanced Logic Scaling and New STCO Opportunities
A. Veloso, B. Vermeersch, R. Chen, P. Matagne,M. Garcia Bardon, G. Eneman, K. Serbulova, O. Zografos, S. H. Chen, G. Sisto, A. Jourdain, H. Arimura,
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
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The evolution towards CMOS 2.0, a Heterogeneous Logic Platform
Geert Hellings, Sheng Yang,Pieter Weckx,Marie Garcia Bardon, Maarten Van de Put,Julien Ryckaert
Extended Abstracts of the 2023 International Conference on Solid State Devices and Materials (2023)
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3D Stacked Devices and MOL Innovations for Post-Nanosheet CMOS Scaling
N. Horiguchi, H. Mertens, T. Chiarella, S. Demuynck, V. Vega-Gonzalez, A. Vandooren,A. Veloso,M. Garcia Bardon, G. Sisto, A. Gupta, Z. Tokei, S. Biesemans,
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
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Environmental Impact of CMOS Logic Technologies
L-A Ragnarsson,M. Garcia Bardon,P. Wuytens,G. Mirabelli,D. Jang, G. Willems,A. Mallik,A. Spessot,J. Ryckaert,B. Parvais
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)pp.82-84, (2022)
引用3浏览0EIWOS引用
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Design exploration of IGZO diode based VCMA array design for Storage Class Memory Applications
M. Gupta, M. Perumkunnil,A. Fantini, S. A. Chamazcoti, W. Kim,M.G. Bardon,G.S. Kar, A. Furnémont
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)pp.241-244, (2022)
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