Technical program committee 2014

Melanie Etherton,Nathan Jack,Shih-Hung Chen,Charvaka Duvvury, Xiaofeng Fan,Farzan Farbiz,Gianluca Boselli,Dimitri Linten,Kai Esmark,Timothy J. Maloney, Markus Mergens, QPX GmbH, Mototsugu Okushima, Javier A. Salcedo,Mirko Scholz, Stephen Beebe,Geert Hellings,Robert Ashton, Fabrice Caignet, Wei Huang, David Pommerenke, Ankit Srivastava, Richard Wong, Michelle Lam, Ron Gibson, Victor Cao, Akram Salman

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014（2014）

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摘要

-vTLP/HBM/MM/CDM Device Testing: Testers, Methods, and Correlation Issues Sub-Committee Chair: Theo Smedes, NXP Semiconductors Robert Ashton, ON Semiconductor Evan Grund, Grund Technical Solutions, LLC Marty Johnson, Texas Instruments, 1m: David J ohnsson, High Power Pulse Instruments GmbH Tom Meuse, Thermo Fisher S cientijic Masanori Sawada, HANW A Electronics Wolfgang Stadler, Intel Mobile Communications

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