Currently, there is a tendency to use the hardware means of information protection in extreme operating conditions, in particular, in the presence of powerful radiation. In this regard, the problem of assessing the stability of the hardware means of information protection operation is being updated, which is determined by the radiation resistance of the large digital integrated circuits (LSI) that make up them. Methods for ensuring information security in the form of static and dynamic characteristics, which are based on the use of functional-logical modeling of large digital integrated circuits (LSI) under the influence of ionizing radiation, are considered. It is shown that in some cases, information security is characterized by deterministic and non-deterministic failures when exposed to ionizing radiation. Methods for predicting the information security of LSI under the influence of ionizing radiation are proposed, which are based on models of fuzzy digital and probabilistic reliability automata. In the first case, the behavior of complex devices is determined by the specific ratio of radiation-sensitive parameters of the elements, in the second case by the statistical spread of switching moments leading to changes in the logic of the same type of sample. Moreover, the nature of their changes during irradiation depends on many factors, including the type of radiation, its intensity and spectrum, the type of criterion parameter that characterizes the radiation resistance of the LSI, and the mode of operation of the microcircuits.Conducting such a comparison is a necessary step for an adequate assessment of the radiation resistance of the LSI, which allows us to develop a procedure for analyzing the resistance of digital devices.

The analysis of the LSI behavior under radiation exposure at functional and logical level of description was carried out. It is shown that there are deterministic and non-deterministic failures typical when exposed to ionizing radiation. In the first case, the behavior of complex devices is determined by the specific ratio of the radiation-sensitive parameters of the elements, in the second case—the statistical variation of the failure threshold levels for the same type of samples.

The article presents an analysis of microwave LSI behavior under radiation exposure at the functional-logical level of description. The analysis is based on fuzzy digital automaton and topological probabilistic models of workability assessment. It is shown that in certain cases both deterministic and non-deterministic failures are typical. Each operation threshold in logic elements under radiation influence has a zone of uncertainty and can be expressed quantitatively by a fuzzy number. This case, the real nature of microwave LSI radiation behavior is determined by the specific ratio of radiation-sensitive parameters of its elements and by taking into account the influence of their statistical scatter. Methods are proposed for simulating failures of microwave LSI under radiation exposure that are based on the model of a fuzzy digital Brauer automaton and a probabilistic reliability automaton.

The methods of functional-logical modeling of very large digital integrated circuits (VLSI) under the influence of ionizing radiation are considered. It is shown that the multiplicity of the node and the power of the spectrum are more accurately described when using the concept of fuzzy multiplicity. Methods are proposed for predicting LSI failures when exposed to ionizing radiation, which are based on the model of fuzzy digital and probabilistic reliability automata.

The methods of information security, which are based on the use of functional-logical modeling of very large digital integrated circuits (VLSI) under the influence of ionizing radiation are considered. It is shown that the multiplicity of the node and the power of the spectrum are more accurately described when using the concept of fuzzy multiplicity. Methods are proposed for predicting LSI failures when exposed to ionizing radiation, which are based on the model of fuzzy digital and probabilistic reliability automata. Moreover, the nature of their changes during irradiation depends on many factors, including the type of radiation, its intensity and range, type a criteria parameter characterizing the radiation resistance of ICs and work mode. Therefore, in different ranges of levels or intensities of the impact of the IC model can be either of fuzzy or probabilistic nature. Carrying out such a comparison is an essential step in the overall analysis of the IC radiation resistance.

The methods of functional-logic simulation of radiation-induced failures of electronic systems based on the Brauer fuzzy state machine model are presented. Recommendations for methods of radiationinduced failure prediction in the electronic component base are given. Theoretical and experimental results for the radiation fault tolerance of 1617 large-scale integrated circuits based on complementary metal–oxide–semiconductor structures are given as an example.

The technique of functional-logical simulation of System-on-Chip (SoC) total dose radiation failures is presented based on fuzzy logic sets theory. An analysis of the capabilities of this approach for IP-blocks radiation behavior is carried out along with the analysis of operating modes under irradiation influence on IP-blocks radiation behavior. The following elements of this technique application for simulation of dose radiation failures of various types of IP-units are studied: logical elements, memory units and cells, processors. Examples of criterial membership functions and operability functions construction are given for these IP-units and for various critical parameters characterizing their failures. It is shown that when modeling total dose failures it is necessary to take into account the influence of the functional mode on the model parameters. The technique proposed allows improving the reliability of the SoC radiation hardness estimation, also for the purpose of solving the problems of information security of electronic devices.

The article considers digital ICs safe operation predicting methods under the influence of radiation based on fuzzy digital automaton and topological probabilistic models for assessing their performance. While ICs radiation behavior actual nature is determined by the specific ratio of the radiation-sensitive parameters of its elements and taking into account the impact of their statistical dispersion. ICs failures modeling methods under exposed to radiation, which are based on models of fuzzy digital automaton Brauer and probabilistic reliability of the machine.

The methods of functional-logical simulation of digital integrated circuits (ICs) exposed to radiation are observed. It is shown that in a number of cases functional and electrical deterioration of ICs performances have both deterministic and non-deterministic nature. Methods for simulating IC failure exposed to radiation based on the model of fuzzy digital machine and Brauer probabilistic reliability machine are proposed.

In this paper digital systems safety operation prediction methods under radiation influence, founded on Brower digital automate and a digital systems operation estimate topological probabilistic models, is considered.

This paper describes simulation methods of the radiation reliability of the performance of digital large-scale integrated circuits based on fuzzy digital Brauer automata and topological probabilistic models of performance evaluation.

Methods are proposed to estimate the relationship between probabilistic and order models for simulating functional failures of the large-scale integrated circuits (LSICs) based on Brauer’s fuzzy digital automaton and on a probabilistic automaton for reliability evaluation. In the first case, the behavior of the LSIC is determined by varying static and dynamic parameters; in the second case, by the statistical straggling of threshold failure levels.

An approach to estimating the relationship between probabilistic and fuzzy models is proposed for simulating failures of large-scale integrated circuits (LSICs). These models are based on Brouwer’s fuzzy digital automaton and topological probabilistic models for estimating the functionality of digital devices. In the first case, the behavior of an LSIC is determined by the variation of deterministic static and dynamic parameters, and, in the second case, by the statistical dispersion of threshold failure levels.

Предложен подход к оценке взаимосвязи вероятностных и нечетких моделей для моделирования функциональных отказов БИС, которые основаны на нечетком цифровом автомате Брауэра и топологических вероятностных моделях оценки работоспособности цифровых устройств. В первом случае поведение БИС определяется изменением детерминированных статических и динамических параметров, во втором – статистическим разбросом пороговых уровней отказа.

In the paper prediction is offered of safety digital systems operation under radiation influence methods, based on fuzzy Brouwer’s automatic and digital device operability estimating topological probabilistic models.

Methods of construction of the criterial membership function (CMF) in order to provide the resistance of large-scale integrated circuits (IC) to radiative and electromagnetic radiations at the functional-logical description level are described. These functions are based on a model of the Brauer fuzzy digital automation. A principal distinction of this method from conventional ones is the possibility of the account in the explicit form of the dependence of the resistance of functional-logical models of LSICs on the effect type, operational mode, functional state, and circuit solutions. Algorithms and recommendations on the methods of prediction of radiative effects in LSICs caused by electromagnetic, steady-state, and pulsed radiations are given.

Methods of functional-logical simulation of the radiation behavior and effect of electromagnetic radiation on integrated circuits (ICs) based on the model of the Brauer digital fuzzy automation are considered. A principal distinction of this method from conventional ones is the possibility of taking into account the dependences of radiation resistance and pulsed electric strength on operation mode, functional state, and construction- topological and circuit parameters of ICs in the explicit form in functional-logical models of ICs. The procedures of construction of membership criterion functions of basic elements for ICs of various technologies are considered. Algorithms and recommendations for methods of predicting pulsed electric strength and transient and residual radiation effects in ICs are given. As an example, theoretical and experimental results of simulation of the quality of functioning of LSIC ROM of a series 1656 with respect to residual damages are presented.