基本信息
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职业迁徙
个人简介
1. More than 70 publications, 5 granted patents and 2 patent applications in the area of memory testing
2. Testing FinFET-based 16/14/10/7/5nm memories, investigating challenges of 5nm technology nodes
3. External memory test (2.5D, 3D architectures using DDR, LPDDR, HBM and Wide I/O interfaces)
4. Functional Safety and testing automotive systems, ISO 26262
5. Testing SRAM, ROM, DRAM, CAM, Flash, MRAM (test algorithms for fault detection, diagnosis and localization)
6. Built-in self-test (BIST) solutions
7. Testing analog-mixed signal, digital and interface IPs
8. Inductive fault analysis (shorts, opens, address decoder faults, process variation faults)
9. Investigating memory scrambling information
10. Exploring IEEE standards (1500, 1149.1, 1149.10, 1687, P1838)
研究兴趣
论文共 60 篇作者统计合作学者相似作者
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期刊级别
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2024 IEEE 42ND VLSI TEST SYMPOSIUM, VTS 2024 (2024)
IEEE Design & Testno. 99 (2024): 1-1
Keqing Ouyang,Minqiang Peng, Yunnong Zhu, Kang Qi,Grigor Tshagharyan,Arun Kumar,Gurgen Harutyunyan, Isaac Wang
2023 IEEE 41st VLSI Test Symposium (VTS) (2023)
IEEE European Test Symposiumpp.1-4, (2023)
2023 IEEE International Test Conference (ITC)pp.388-392, (2023)
2023 IEEE 41st VLSI Test Symposium (VTS)pp.1-4, (2023)
2023 IEEE International Test Conference (ITC)pp.383-387, (2023)
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作者统计
#Papers: 60
#Citation: 535
H-Index: 16
G-Index: 21
Sociability: 5
Diversity: 2
Activity: 8
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