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论文共 10 篇作者统计合作学者相似作者

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A Systematic Study of HCI Improvement in FinFET with Source/Drain Implant and Geometry Modulation
Rakesh Ranjan, Pavitra R. Perepa,Ki-Don Lee, Ashish K. Jha, Kartika C. Sahoo, Kayla N. Sanders, Robert Moeller, Prateek Sharma, Minhyo Kang, Peter Kim, Kwanjae Song, Yongwoo Jeon,
2024 IEEE International Reliability Physics Symposium (IRPS) (2024)
引用0浏览0引用
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Impacts of Post-Cu CMP Queue Time on Reliability
Yinghong Zhao, Hokyung Park,Ki-Don Lee, Liangshan Chen,Manisha Sharma, Sugento Huandra, Hanson Mao, Brian Filemyr Smith, Wei Xia, Joonah Yoon, Junehwan Kim, Myung Soo Yeo,
2024 IEEE International Reliability Physics Symposium (IRPS)pp.1-5, (2024)
引用0浏览0EIWOS引用
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A Systematic Study of HCI Improvement in FinFET with Source/Drain Implant and Geometry Modulation
Rakesh Ranjan, Pavitra R. Perepa,Ki-Don Lee, Ashish K. Jha, Kartika C. Sahoo, Kayla N. Sanders, Robert Moeller, Prateek Sharma, Minhyo Kang, Peter Kim, Kwanjae Song, Yongwoo Jeon,
2024 IEEE International Reliability Physics Symposium (IRPS)pp.5A.1-1-5A.1-6, (2024)
引用0浏览0EIWOS引用
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Polarity Dependency of MOL-TDDB in FinFET
Manisha Sharma,Hokyung Park,Yinghong Zhao,Ki-Don Lee, Liangshan Chen, Joonah Yoon,Rakesh Ranjan, Caleb Dongkyan Kwon,Hyewon Shim,Myungsoo Yeo, Shin-Young Chung,Jon Haefner
IRPSpp.1-3, (2023)
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Impact of Barrier Metal Thickness on SRAM Reliability
Rakesh Ranjan, Pavitra Ramadevi Perepa,Ki-Don Lee,Hokyung Park, Peter Kim, Ganesh Chakravarthy Yerubandi,Jon Haefner, Caleb Dongkyun Kwon,Minjung Jin, Wenhao Zhou,Hyewon Shim, Shin-Young Chung
IRPSpp.1-6, (2023)
引用0浏览0EIWOS引用
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Polarity Dependence and Metal Density Impact on Multi-Layer Inter-Level TDDB for High Voltage Application
Yinghong Zhao,Ki-Don Lee,Manisha Sharma, Joonah Yoon,Rakesh Ranjan,Iqbal Mahmud, Caleb Dongkyan Kwon,Myung Soo Yeo
2022 IEEE International Reliability Physics Symposium (IRPS)pp.1-4, (2022)
引用1浏览0EIWOS引用
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Reverse Body Bias Dependence of HCI Reliability in Advanced FinFET
Md Iqbal Mahmud,Rakesh Ranjan,Ki-Don Lee, Pavitra Ramadevi Perepa, Caleb Dongkyun Kwon,Seungjin Choo,Kihyun Choi
IEEE International Reliability Physics Symposium (IRPS)pp.P58-1-P58-4, (2022)
引用3浏览0EIWOS引用
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Systematic Study of Process Impact on FinFET Reliability
Rakesh Ranjan,Ki-Don Lee,Md Iqbal Mahmud, Mohammad Shahriar Rahman, Pavitra Ramadevi Perepa, Charles Briscoe Larow, Caleb Dongkyun Kwon, Maihan Nguyen,Minhyo Kang,Ashish Kumar Jha, Ahmed Shariq, Shamas Musthafa Ummer,
2021 IEEE International Reliability Physics Symposium (IRPS)（2021）
引用2浏览0EIWOS引用
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Trap Density Modulation For Io Finfet Nbti Improvement
Rakesh Ranjan, Charles B. LaRow,Ki-Don Lee,Minhyo Kang, Pavitra R. Perepa, Md. Shahriar Rahman, Bong Ki Lee, David Moreau, Carolyn Cariss-Daniels, Timothy Basford, Colby Callahan, Maihan Nguyen,
2020 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)（2020）
引用2浏览0EIWOS引用
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