Objective: substantiation for the use of modified submandibular approach for treating odontogenic infection of the mouth floor. Materials and methods. 62 patients were involved in this prospective study. The main group consisted of 30 patients with mean age 46.8±11.8, 16 men (53.3%), 14 women (46.7%). Patients were treated with the modified submandibular approach with partial incision of the mandibulohyoid sac; the application for invention No. 2019118924, priority of 17.06.2019. The comparison group consisted of 32 patients with mean age 48.0±11.8, 17 men (53.1%), 15 women (46.9%). Patients were treated with the standard submandibular approach. The main group and the comparison group were comparable in age and sex (p>0.05), the background pathology and antibacterial therapy. Results. The modified approach allows to reduce the time of postoperative surgical site purification from 5.9±1.9 days in the comparison group, in the main group up to 4.5±1.1 days (p<0.05); granulation tissue from 5.1±2.0 days in the comparison group, in the main group up to 3.7±1.0 days (p<0.05); secondary suture application from 7.0±2.2 days in the comparison group, in the main group up to 5.8±1.2 days (p<0.05). There were no differences in the average bed days (the main group – 8.2±0.9 days, the comparison group – 9.0±2.1 days, p>0.05) and the spread of the infection to adjacent organs (1 case in the main group, 3 cases in the comparison group, p>0.05). Conclusion. The modified method of treating odontogenic infection allows reducing the time of postoperative wound purification, and facilitating the appearance of granulation tissue and application of sutures.

Results of atomic force microscopy (AFM) probes-cantilevers modification by focused ion beams (FIB) experimental researches are presented. With use of FIB treatment are received cantilevers with tip radius than 10 nm and aspect ratio 1:50. With the help it is ionic-stimulirovannogo sedimentation by FIB are received cantilevers with a tungsten tip in length 5 microns and radius 50 nm. It is shown that application modified by FIB probes allows increasing resolution and reliability of measurements of test objects by AFM. The received results can be used at research of microand nanoelectronics, microand nanosystems structures.

The idea is to present the results of production methods of nanoelectronics materials and structures and nanosystems technique based on the cluster type automatic platform NANOFAB NTK-9. Experimental research of microand nanofluidics systems using focused ion beam milling. Milling of microlenses structures. Vanadium and Zinc oxide thin film deposition and their properties researching. Growing aligned arrays of hybrid carbon nanostructures.