The investigation of chemical and topographic structure of activated tungsten cathodes has great importance in the optimisation of high pressure discharge lamps. In spite of the numerous investigations, there are many open questions in connection to the transport mechanism of the activator substances from the reservoir to the electron emitting tip. Investigations of tungsten cathodes activated by Ba2CaWO6 were performed by means of simultaneous surface analytical methods: scanning electron microscopy (SEM), electron microprobe (EMP), cathodoluminescence (CL) and secondary ion mass spectrometry (SIMS). The topography of the surface was studied by SEM and CL, giving the result that the activator substances are inhomogeneously distributed on the surface of the tip. According to the EMP analyses the chemical composition of the observed precipitates on the surface of the samples corresponds to the original activator compound with O excess. According to the SIMS spectra, parallel migration of atomic and oxide species is possible. Lateral and in-depth investigations show that the substances migrate mostly on the surface of the tungsten rod, but their minor quantity may migrate also along the grain boundaries. Ratio of fluxes of migration channels could be estimated from the crystal sizes determined and are compared to the heat of formation of the oxides.

The migration of hydrogen in metals plays an important role in many fields of science and technology. Secondary ion mass spectrometry (SIMS) is a suitable method for analysis of hydrogen in solids, but there are still unsolved problems (sputter enhanced migration, stable reference materials for quantification). The complex process of the migration of hydrogen and the secondary H(+) ion emission from a homogeneous solid matrix (Zr(50)Ni(25)Cu(25) amorphous alloy) of high H-concentration (H/Me atomic ratio up to 0.9) was studied. A kinetic model for consecutive diffusion and sputtering-enhanced desorption processes was set up. Sputtering-influence and long-time (months) experiments were carried out for the study of hydrogen storage and outgassing of amorphous alloys. Rate constants for ion induced desorption and outgassing, and the activation energy for diffusion, were calculated. (C) 1998 John Wiley & Sons, Ltd.

The energy dependence of secondary ion yield is determined both by the (Sigmund-Thompson or Boltzmann type) energy distribution function of the secondary (neutral) particles and by the (exponential or power law) ionization probability. The combination of these functions results in four possible mathematical models of secondary ion emission. The energy distributions of monoatomic singly charged positive ions emitted from pure metals and from amorphous alloys were studied experimentally. The parameters of the secondary ion emission models were calculated by fitting the equations. The binding energies obtained were compared with independent experimental data taken from the literature (dissociation energy, enthalpy of formation). Correlation between these values suggests that there are different possible emission pathways for different ion species emitted from solid targets. (C) 1997 by John Wiley & Sons, Ltd.

The energy distribution of protons sputtered from a metallic glass sample Zr50Ni25Cu25 with 90% hydrogen embedded in the lattice was investigated. The energy distribution was measured for various energies of the primary Ar+ ions. It turns out that the energy dependence of the emitted protons is well represented by a combination of a Maxwell-Boltzmann distribution function for the sputtered neutrals and the ionisation probability of the hydrogen atoms. We conclude that the hydrogen atoms embedded in the disturbed lattice of the alloy behave like an ideal gas with a high atom temperature. The temperature determined in the experiments is in a good agreement with the energy transferred from the primary ions to the hydrogen atoms at the surface calculated by computer simulations.

physica status solidi (a)Volume 139, Issue 2 p. K93-K95 Defects; Nonelectronic Transpport Temperature dependence of the energy distribution of secondary ions H. Düsterhöft, H. Düsterhöft Department of Physics, Humboldt University of Berlin Search for more papers by this authorK. P. Winter, K. P. Winter Department of Physics, Humboldt University of Berlin Search for more papers by this author H. Düsterhöft, H. Düsterhöft Department of Physics, Humboldt University of Berlin Search for more papers by this authorK. P. Winter, K. P. Winter Department of Physics, Humboldt University of Berlin Search for more papers by this author First published: 16 October 1993 https://doi.org/10.1002/pssa.2211390231 Invalidenstr. 110, D-10115 Berlin, Federal Republic of Germany. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat No abstract is available for this article. Volume139, Issue216 October 1993Pages K93-K95 RelatedInformation

The energy distribution of mono-atomic single charged positive ions emitted from pure metals and amorphous alloys of Fe80B17X3 type was measured. The effect of matrix and bombarding ion was studied. Amorphous alloys are suitable model materials for studies of multicomponent systems being homogeneous without crystal effects. The effect of Ar+ and O+2 primary ions were compared in the presence of oxygen flooding. The sensitive comparison of energy distribution curves was made by functions M(E) and X(E) defined here. Both the nature of the ion and the emitting surroundings determine the energy distribution, for some elements, however, the nature of the emitted element is dominant. The present results also contribute to the development of quantification of secondary ion mass spectrometry.

It is known from previous round robin experiments [1] that relative sensitivity factors, obtained on identical samples by different SIMS instruments, frequently disagreee by a factor of up to 50 and that element concentrations, derived from the raw peak height data by some quantification algorithm, still disagree by a factor of ~5. Two methods, both based on the relative sensitivity factor (RSF) quantification scheme, have been suggested to obtain inter-laboratory standardization of quantitative SIMS analyses: (a) “Standard — Transfer”; for every element/matrix system to be analyzed, a well characterized external standard sample is distributed to each laboratory. Previous to analysis of the unknown, RSFs are determined from the appropriate standard and used for the quantification of the unknown. The method rests on the availability of identical standards in each laboratory and not on the agreement in raw ion intensity data. Each laboratory has to determine its own RSFs previous to each individual analysis. the accuracy is of the order of 20% [2], determined mainly by the accuracy of the standard composition. (b) “Cross-Calibration”; here, the aim is to tune different instruments to give identical RSFs from identical samples. If this can be realized, RSFs can be transferred between instruments and laboratories so that the workload of determining RSFs can be split between laboratories. Standard samples still are required for each unknown/matrix system,but essentially only in that laboratory determining the particular RSF. The accuracy of the method is determined by the quality of the standard and of the instrument tuning.

Experiments are described in which the energy distributions of positive and negative secondary ions are measured for four elements (Si, Fe, Cu, Ta) under Cs+ and Xe+ bombardment. It is shown that the energy dependence of the ratio of two corresponding energy distributions, calculated point by point is in very good agreement with the potential law of energy. With the help of these results the surface ionization model of Šroubek is examined. Es werden Experimente vorgestellt, bei denen die Energieverteilungen von positiven und negativen Sekundärionen für vier Elemente (Si, Fe, Cu, Ta) bei Cs+- und Xe+-Beschuß gemessen wurden. Die Energieabhängigkeit des punktweise aus beiden entsprechenden Energieverteilungen gebildeten Verhältnisses folgt sehr genau einem Potenzgesetz bezüglich der Energie. Mit Hilfe dieser Ergebnisse wird das Oberflächenionisationsmodell von Šroubek überprüft.

ADVERTISEMENT RETURN TO ISSUEPREVArticleNEXTCross calibration of secondary ion mass spectrometersFriedrich. Ruedenauer, Wolfgang. Steiger, Miklos. Riedel, Horst E. Beske, Horst. Holzbrecher, Michael. Gericke, Carl Ernst. Richter, Michael. Rieth, Manfred. Trapp, and . et al.Cite this: Anal. Chem. 1985, 57, 8, 1636–1643Publication Date (Print):July 1, 1985Publication History Published online1 May 2002Published inissue 1 July 1985https://doi.org/10.1021/ac00285a030RIGHTS & PERMISSIONSArticle Views23Altmetric-Citations10LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InReddit PDF (1009 KB) Get e-Alerts Get e-Alerts

As it is well-known,one of the most serious problem of the quantitation of SIMS is that the secondary ion yield of the elements varies strongly with matrix and concentration. This problem has been studied by numerous authors; usually, however,they did not analyze the influence of the energy distribution of the secondary ions on this effect. The works dealing with the influence of the matrix on the energy spectra in detail also used polycrystal-line, multiphase alloys. Therefore, the yields were mean values of the differently emitting surface sites [1,2]. To eliminate this imperfection of multicomponent targets, reliably homogeneous and isotrope materials, amorphous alloys ( metallic glasses ) were used.

In this paper energy distributions of singly charged ions of Bi, Sb, W, Th, Cu, Zn and Cd as well as ions of some of their oxides emitted from the pure elements are presented. The purity of the target materials was ranged from 99 % (W, Th) to 99.999 % (other elements) ; all the materials had a polycrystalline structure and were mechanically polished.

physica status solidi (a)Volume 64, Issue 1 p. K27-K30 Short Note The mean kinetic energy of sputtered atoms as a function of the angle of emission D. H. Ildebrandt, D. H. Ildebrandt Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte Massenspektrometrie Search for more papers by this authorR. Manns, R. Manns Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte Massenspektrometrie Search for more papers by this authorH. Düsterhöft, H. Düsterhöft Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte Massenspektrometrie Search for more papers by this author D. H. Ildebrandt, D. H. Ildebrandt Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte Massenspektrometrie Search for more papers by this authorR. Manns, R. Manns Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte Massenspektrometrie Search for more papers by this authorH. Düsterhöft, H. Düsterhöft Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte Massenspektrometrie Search for more papers by this author First published: 16 March 1981 https://doi.org/10.1002/pssa.2210640154Citations: 1 Invalidenstr. 42, DDR-104 Berlin, DDR. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat Citing Literature Volume64, Issue116 March 1981Pages K27-K30 RelatedInformation

The results of measurements of the positive secondary-ion yield S+ and the sputtering efficiency γ at a primary-ion energy of 12 keV under dynamical conditions are reported. He+, Ne+, Ar+, Kr+, and Xe+ions served as bombarding ions (Z1-dependence). 14 elements are investigated (Z2-dependence), and the sputtering yields S were added wherever they were available from the literature. The positive secondary ion yield decreases with increasing mass of the bombarding ions. Using the values of S, S+, and γ as functions of Z1 and Z2, the Schroeer model of adiabatic surface ionization is examined and the exponents n are determined by a quotient method. The different dependences of S and S+ are discussed on the basis of this model. Es werden die Ergebnisse von Messungen der positiven Sekundärionenausbeute S+ und des Energieemissionskoeffizienten (sputtering efficiency) γ bei 12 keV Primärionenenergie unter dynamischen Bedingungen mitgeteilt. Als Beschußionen (Z1-Abhängigkeit) dienten +, Ne+, Ar+, Kr+, and Xe+ Ionen. Es werden 14 Elemente (Z1-Abhängigkeit) untersucht und, sowiet aus der Literatur verfügbar, die Zerstäubungsausbeuten Shinzugefügt. Die positive Sekundärionenausbeute fällt mit steigender Beschußionenmasse. Mit den Werten für S, S+ und γ als Funktion von Z1 und Z2 wird eine Überprüfung des Schroeerschen Modells der adiabatischen Oberflächenionisation und die Bestimmung des Exponenten n nach einer Quotientenmethode vorgenommen. Die verschiedenen Abhängigkeiten von S und S+ werden auf der Grundlage dieses Modells diskutiert.

physica status solidi (a)Volume 39, Issue 2 p. K147-K150 Short Notes The Energy Distribution of Positive Secondary Ions Emitted from Metal and Semiconductor Targets Bombarded with 12 keV Ar+ Ions H. Düsterhöft, H. Düsterhöft Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte MassenspektrometrieSearch for more papers by this authorA. Ihlenfeld, A. Ihlenfeld Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte MassenspektrometrieSearch for more papers by this author H. Düsterhöft, H. Düsterhöft Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte MassenspektrometrieSearch for more papers by this authorA. Ihlenfeld, A. Ihlenfeld Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte MassenspektrometrieSearch for more papers by this author First published: February 1977 https://doi.org/10.1002/pssa.2210390259Citations: 5AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Citing Literature Volume39, Issue2February 1977Pages K147-K150 RelatedInformation

physica status solidi (a)Volume 36, Issue 1 p. K93-K97 Short Note Experimental proof of a theoretical relation for the probability of positive ion excitation by bombardment of solid surfaces with 12 keV Ar+ ions H. Düsterhöft, H. Düsterhöft Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte MassenspektrometrieSearch for more papers by this authorR. Manns, R. Manns Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte MassenspektrometrieSearch for more papers by this authorD. Hildebrandt, D. Hildebrandt Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte MassenspektrometrieSearch for more papers by this author H. Düsterhöft, H. Düsterhöft Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte MassenspektrometrieSearch for more papers by this authorR. Manns, R. Manns Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte MassenspektrometrieSearch for more papers by this authorD. Hildebrandt, D. Hildebrandt Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte MassenspektrometrieSearch for more papers by this author First published: 16 July 1976 https://doi.org/10.1002/pssa.2210360169Citations: 10AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Citing Literature Volume36, Issue116 July 1976Pages K93-K97 RelatedInformation

physica status solidi (b)Volume 75, Issue 2 p. K173-K175 Short Note Z1-Dependence of Kinetic Ion-Electron Emission from a Gas-Covered Stainless-Steel Surface S. Rogaschewski, S. Rogaschewski Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte MassenspektrometrieSearch for more papers by this authorH. Düsterhöft, H. Düsterhöft Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte MassenspektrometrieSearch for more papers by this author S. Rogaschewski, S. Rogaschewski Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte MassenspektrometrieSearch for more papers by this authorH. Düsterhöft, H. Düsterhöft Sektion Physik der Humboldt-Universität zu Berlin, Bereich Angewandte MassenspektrometrieSearch for more papers by this author First published: 1 June 1976 https://doi.org/10.1002/pssb.2220750260Citations: 9AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Citing Literature Volume75, Issue21 June 1976Pages K173-K175 RelatedInformation