We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single event effects (SEE), proton-induced displacement damage dose (DDD), and total ionizing dose (TID).
The results of single event effect (SEE) experiments on fully-depleted silicon-on-insulator (FDSOI) static random- access memory (SRAM). Testing was conducted using several different ion species from the 88-inch cyclotron at the Lawrence Berkeley National Laboratory (LBNL). The SRAM and register file structures showed sensitivity to the lowest tested LET (~3 MeV-cm 2 /mg), and an approximate saturated cross section around $1\mathrm{x}10^{-10}$ cm2, More importantly, the SRAM performance was consistent with earlier tests and extended results by adding register file blocks which utilized full assist structures.
The Aerospace Corporation performed total ionizing dose (TID) and proton testing on the AMD Ryzen 3200G processor. The Ryzen processor is a system on chip that contains a 4-core central processing unit (CPU) and an integrated graphical processing unit (GPU). No changes in CPU performance were observed until 600 krad(Si) of dose, while changes to GPU performance were first noticed at 500 krad(Si). Degradation in CPU performance was only observed in processes requiring access to off chip memory, suggesting that radiation effects are most prevalent in the I/O circuitry and not in the digital logic or internal registers.
This paper reports recent single-event effects measurements results for a variety of microelectronic devices that include a voltage level translator, bus driver/buffer, DC-DC buck converter, load switch, power protection mux, transceiver, wireless transceiver, and wireless MCU. The data were collected to evaluate these devices for possible use in NASA Mars missions.
We report SEE performance of A53 processors in Raspberry Pi 3B+ (BCM2837) and MYiRTech MYC-C8MMQ6 (IMX8M). Error correction features and process SEE performance result in significant reduction in SEFI sensitivity.
