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    IEEE Embedded Systems Letters

    IEEE Embedded Systems Letters

    JournalISSN 1943-0663eISSN 1943-0671中科院 计算机科学 4区

    年发文量

    研究主题

    论文(1003)

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    1NPEX: an NPU–PIM Design Space Explorer for Edge LLM Decoding
    Jaewoo Son,Soonhoi Ha

    Edge large language model (LLM) decoding on heterogeneous neural processing unit (NPU)–processing-in-memory (PIM) systems demands comprehensive design space exploration (DSE) across memory organization, operator mapping, and decoding configurations. This letter presents NPEX, a trace-driven SystemC/TLM design space explorer that captures dynamic runtime interactions overlooked by static baselines. By treating execution traces as dependence templates and resolving completion timelines online via DRAM/PIM backend models, NPEX enables high-fidelity architectural comparisons under identical workloads. Unlike conventional latency-sum (LS) and ideal-overlap (IO) models that lead to suboptimal design points, NPEX successfully identifies a balanced, partitioned architecture. At the NPEX-selected point, LS overestimates latency by up to 26.2%, while IO underestimates it by up to 13.3% and overoptimistically favors an aggressive speculation length $K$ . These results highlight that reliable NPU–PIM exploration necessitates online, trace-driven simulation.

    2026
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    2FedSRAM-PUF: Federated Bit-Error Correction for Reliable SRAM PUF Authentication
    Chandranshu Gupta, Meghna Kapoor,Gaurav Varshney

    The static random access memory (SRAM)-based physical unclonable functions (PUFs) provide a lightweight hardware primitive for device authentication in embedded systems. However, their practical deployment is limited by noise-induced bit instability, which degrades response reproducibility across repeated power-up measurements. The existing reliability-enhancement methods typically rely on centralized processing, error-correcting codes, or helper data, which may introduce additional overhead or expose sensitive device-specific information. This letter presents a federated learning (FL)-based framework for improving SRAM PUF reliability through distributed bit-error correction. A lightweight multilayer perceptron model is trained collaboratively across devices to learn bit-level instability patterns while keeping raw SRAM responses local to each device. In addition to clean-response evaluation, we examine robustness under emulated noise-induced drift to assess the effect of persistent bit perturbations on correction performance. The experimental results on SRAM measurements from eight ESP32 devices show that the proposed approach reduces average BER by 46.49% in the clean setting and by 36.19% under emulated noise-induced drift, while improving response stability for downstream authentication.

    2026
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    3NTV-CIM: System-Level Assessment of Near-Threshold Digital Compute-in-Memory Accelerators
    Panagiotis Chaidos, Alexis Maras, Georgios Alexandris,Dimitrios Soudris,Sotirios Xydis

    To deal with the growing needs of deep neural networks (DNNs), energy efficiency techniques such as near-threshold voltage (NTV) have been deployed, promising to reduce energy consumption by decreasing the supply voltage of accelerators. Despite its potential, the systematic application of NTV in digital compute-in-memory (DCIM) and the interplay between voltage scaling, performance, power, and reliability at the DNN level remain underexplored. In this work, we propose a system-level design framework for modeling, mapping, and architectural exploration of DCIM accelerators operating under NTV. We model and explore the configuration space of multivoltage-island DCIMs and integrate hardware (HW)-awareness that accounts for process variation (PV) and device-level reliability to avoid errors during computation. We evaluate in comparison to synthesized DCIMs in 22 nm, targeting CNNs and a Vision Transformer. Our results show up to $\times 3.35$ reduction in energy consumption of NTV DCIMs against equivalent standard compute-in-memory (CIM).

    2026
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    4Privacy-Preserving Robustness-Guided Testing
    Charles Koll,Houssam Abbas,Mike Rosulek

    In industries like semi-conductors and aerospace, it is common for the design company to contract out part of the testing process to a Testing-as-a-Service (TaaS) company. In such a setup, both parties want to keep their intellectual property private (i.e. unknown to the other party): namely the design and its output traces for the designer, and the detailed correctness specifications for the tester. We demonstrate a practical way for conducting provably private TaaS using a cryptographically secure multi-party computation protocol. We do so for the common setup where the specification is in Signal Temporal Logic, and testing is done using robustness-guided falsification. Our implementation carefully separates the steps of falsification, and manages to be maximally secure, in the sense that the parties learn the absolutely minimum necessary for falsification. For up to a 100-dimensional input search space, the generation of one test takes less than 80 msec, and the overhead of the privacy-preserving protocol is less than 6x. These numbers mean that privacy-preserving TaaS is practical, thus enabling TaaS in security-sensitive industries.

    2026
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    5Why Are Differentiable Weightless Neural Networks Robust to Sensor Noise? Three Mechanisms for Edge HAR
    Chaebin Lee, Jihyeon Hwang, Taehong Min, Seung Eun Lee

    Always-on human activity recognition (HAR) on wearable devices demands $\mu $ J-scale inference per sample. Differentiable weightless neural networks (DWNs) meet that budget by replacing arithmetic with lookup table (LUT) computation, and prior work reports 56–104 nJ per sample for DWN inference on FPGAs. How a deployed DWN responds to sensor-level input noise, and why, has nevertheless received little quantitative analysis. We quantify DWN robustness to Gaussian noise and sensor drift on UCI HAR across eight thermometer-encoding bit-widths ( $b \in \{10, {\dots },28\}$ ), decompose it into three mechanisms, and translate each mechanism into a sizing cue that hardware designers can read off the trained model. LUT-level noise absorption is largely invariant to both encoding bit-width and noise type. Accuracy is not: at matched rms magnitude, negative drift costs 27 versus 11 pp for positive drift. We trace this asymmetry downstream of the LUT layer, to the class-wise popcount margin.

    2026
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    高被引作者

    作者引用发文
    Luca Benini3094
    Bashir M. Al-Hashimi3024
    Geoff V Merrett2982
    Domenico Balsamo2881
    Alex Weddell2881
    Davide Brunelli2881
    Minho Ha2161
    Sunggu Lee2161
    Bill Lin1866
    Ryan Kastner1725

    高产作者

    作者引用发文
    Nikil Dutt15614
    Jörg Henkel9412
    Akash Kumar3710
    Soumyajit Dey229
    Kostas Siozios618
    Anirban Sengupta128
    D. J. Soudris728
    Partha Roop387
    Bill Lin1866
    Swarup Bhunia366

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