With the rapid development in e-business and technology, enterprises are now facing fiercer threaten and vague opportunity. How to assist enterprises in gaining competitive advantages through technological and managerial innovation has become a crucial issue to the industrial and academic societies. The main objective of IAM International Conference is to provide a venue where business stakeholders, researchers and experts worldwide can share cutting-edge innovative technologies and managerial theories, exchange valuable experience and form collaborative relationships to promote business innovation and management. We believe it is of immense significance to have an opportunity to share the knowledge from all participants.
Optical microphones represent a promising alternative to the conventional capacitive MEMS microphones, especially when aiming at ultra-low noise applications. This paper reports the design and development of a SiP (System-in-Package) digital optical microphone with 71.6dBA SNR in 5×5×2mm3 package with output sensitivity of -21dBFS/Pa. The system concept is introduced, the design and modeling of the main blocks are presented and the measured results are analyzed.
In many companies throughout the chemical process industries, measurement systems play an important role both in determining the final quality of product, but also in allowing a Six Sigma program to achieve breakthrough performance. Many measurement systems are not up to these tasks. In order to understand the effectiveness of measurement systems, Six Sigma uses the measurement indices of %GR&R and P/T ratio as a part of the improvement strategy. Ineffective measurement systems may lead directly to an increase in “the hidden factory”. This hidden factory is quantified by a calculation of a Cost of Poor Quality or COPQ. Examples of the hidden factory caused by ineffective measurement systems are additional processing costs and loss of product value through unnecessary downgrading. This paper initially defines how the measurement system is a part of the hidden factory. This paper will comment upon the basics of %GR&R and P/T ratio, will highlight the usage of Minitab to perform these analyses, will show examples of measurement systems in industrial applications, and will give suggestions on improving the measurement systems of an organization. The key application from this work is to think of a measurement system as a process, not unlike any manufacturing process. Using the Six Sigma thinking, any process may be studied as a box with inputs and outputs. Study must be done to link poor measurement systems with poor manufacturing and inevitably poor financial performance. Black Belt and Green Belt project work can begin to improve the occasional measurement system. They cannot work alone. It will take a structured approach of evaluating performance of systems (measurement and sampling) correctly, and then developing a systematic procedure to improve performance. This system includes specific training, focused improvement roadmaps, and a project system similar to the system in Six Sigma organizations. The Hidden Factory The Hidden Factory concept is one that is taught early in the Six Sigma course work. It is that area of any process in which rework and non-value exists. If this area is cleaned, a large amount of the Cost of Poor Quality or COPQ of a process is also removed. Tangible Hidden Factory issues include non-reworkable or scrap materials (materials that have lost their product value in processing), over-processed materials (materials processed with non-optimal yields and utilities), and over-analyzed materials (materials that are analyzed inprocess even though the capability is high). The figure below describes the Hidden Factory. In a laboratory setting, the hidden factory also exists. Here the implication of the Hidden Factory is in higher laboratory costs directly and in higher production costs indirectly. The Hidden Factory in a measurement system includes incapable measurement systems (purchased equipment that is incapable and unusable), repetitive analysis (measures that need to be repeated multiple times to achieve usable results, both process and measurement related), and variation issues (various noise issues that produce values that deliver unclear messages to production). The figure below describes this Measurement System Hidden Factory. Inputs Operation First Time Correct Inspect OK
In this tutorial an overview on radiation effects on semiconductor components will be provided under the perspective of CMOS design to mitigate hard errors like latch-up or gate rupture and soft errors (bit upsets and transients). The main radiation hardening techniques, both at circuit and layout levels, will be described with a focus on standard cells, memories (SRAMs and NVMs) and analog components (ADCs and DACs). Testing techniques under irradiation to verify effective hardness suitable for space applications will be described for TID (Total Ionizing Dose with Cobalt 60) and SEE (Single Event Effects with Heavy Ions)
This work presents a low-power, low-temperature-coefficient (TC), digital-friendly RC relaxation oscillator (RxO) for energy-constrained Internet-of-Things (IoT) applications. Implemented in a 22nm CMOS technology that offers only PTAT resistors, the proposed swing-adaptive scheme compensates the first-order TC within the RC stage. Additionally, a clock-gated discrete-time comparator (DT-CMP) scheme is adopted to relax the trade-off between power efficiency and TC. The prototype RxO is measured to have a reference frequency of 700kHz with a TC of 12. $5\mathrm{p}\mathrm{p}\mathrm{m}/{}^{\circ}\mathrm{C}$ (from -$40{}^{\circ}\mathrm{C}$ to 85°C), consuming 760nW with a power efficiency of 1.086nW/kHz.
